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Srinivas-ESrinivas-E
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Release v3.7.1 (20231215) update
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‎test/hal/test_hal.c‎

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/**
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* \file
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* \brief Tests for the cryptoauthlib talib API
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*
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* \copyright (c) 2015-2023 Microchip Technology Inc. and its subsidiaries.
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*
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* \page License
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*
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* Subject to your compliance with these terms, you may use Microchip software
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* and any derivatives exclusively with Microchip products. It is your
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* responsibility to comply with third party license terms applicable to your
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* use of third party software (including open source software) that may
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* accompany Microchip software.
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*
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* THIS SOFTWARE IS SUPPLIED BY MICROCHIP "AS IS". NO WARRANTIES, WHETHER
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* EXPRESS, IMPLIED OR STATUTORY, APPLY TO THIS SOFTWARE, INCLUDING ANY IMPLIED
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* WARRANTIES OF NON-INFRINGEMENT, MERCHANTABILITY, AND FITNESS FOR A
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* PARTICULAR PURPOSE. IN NO EVENT WILL MICROCHIP BE LIABLE FOR ANY INDIRECT,
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* SPECIAL, PUNITIVE, INCIDENTAL OR CONSEQUENTIAL LOSS, DAMAGE, COST OR EXPENSE
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* OF ANY KIND WHATSOEVER RELATED TO THE SOFTWARE, HOWEVER CAUSED, EVEN IF
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* MICROCHIP HAS BEEN ADVISED OF THE POSSIBILITY OR THE DAMAGES ARE
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* FORESEEABLE. TO THE FULLEST EXTENT ALLOWED BY LAW, MICROCHIP'S TOTAL
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* LIABILITY ON ALL CLAIMS IN ANY WAY RELATED TO THIS SOFTWARE WILL NOT EXCEED
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* THE AMOUNT OF FEES, IF ANY, THAT YOU HAVE PAID DIRECTLY TO MICROCHIP FOR
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* THIS SOFTWARE.
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*/
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#include "atca_test.h"
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#include "test_hal.h"
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extern t_test_case_info hal_basic_tests[];
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/* Tests are ordered based on successive capability used by commands. If a command
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* is used in a test then it is tested ahead of the other. E.g. verify is tested
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* using verify
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*/
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static t_test_case_info* hal_test_list[] =
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{
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hal_basic_tests,
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/* Array Termination element*/
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(t_test_case_info*)NULL,
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};
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void run_hal_tests(void)
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{
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RunAllTests(hal_test_list);
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}
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int hal_tests(int argc, char* argv[])
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{
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return run_test(argc, argv, run_hal_tests);
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}
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const char* HAL_HELPER_FILE = "In helper: " __FILE__;
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const char* TEST_GROUP_hal = "hal";
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TEST_SETUP(hal)
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{
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#ifdef ATCA_PRINTF
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printf("\n");
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fflush(stdout);
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fflush(stderr);
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#endif
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UnityMalloc_StartTest();
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ATCA_STATUS status = atcab_init(gCfg);
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TEST_ASSERT_SUCCESS_MSG(status, HAL_HELPER_FILE);
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}
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TEST_TEAR_DOWN(hal)
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{
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ATCA_STATUS status;
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bool test_failed = atca_test_already_exiting();
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bool comm_failed = atca_test_unresponsive();
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if (comm_failed)
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{
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/* Assume if there are comm failures there isn't a point trying to
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continue to fail here */
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status = atcab_wakeup();
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if (!test_failed)
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{
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TEST_ASSERT_SUCCESS_MSG(status, HAL_HELPER_FILE);
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}
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status = atcab_sleep();
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if (!test_failed)
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{
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TEST_ASSERT_SUCCESS_MSG(status, HAL_HELPER_FILE);
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}
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}
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status = atcab_release();
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if (!test_failed && !comm_failed)
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{
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/* Don't override the existing failure location or the global
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status return value */
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TEST_ASSERT_SUCCESS_MSG(status, HAL_HELPER_FILE);
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}
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UnityMalloc_EndTest();
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}

‎test/hal/test_hal.h‎

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/**
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* \file
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* \brief Tests to cover hal layer functionality
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*
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* \copyright (c) 2015-2023 Microchip Technology Inc. and its subsidiaries.
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*
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* \page License
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*
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* Subject to your compliance with these terms, you may use Microchip software
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* and any derivatives exclusively with Microchip products. It is your
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* responsibility to comply with third party license terms applicable to your
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* use of third party software (including open source software) that may
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* accompany Microchip software.
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*
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* THIS SOFTWARE IS SUPPLIED BY MICROCHIP "AS IS". NO WARRANTIES, WHETHER
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* EXPRESS, IMPLIED OR STATUTORY, APPLY TO THIS SOFTWARE, INCLUDING ANY IMPLIED
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* WARRANTIES OF NON-INFRINGEMENT, MERCHANTABILITY, AND FITNESS FOR A
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* PARTICULAR PURPOSE. IN NO EVENT WILL MICROCHIP BE LIABLE FOR ANY INDIRECT,
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* SPECIAL, PUNITIVE, INCIDENTAL OR CONSEQUENTIAL LOSS, DAMAGE, COST OR EXPENSE
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* OF ANY KIND WHATSOEVER RELATED TO THE SOFTWARE, HOWEVER CAUSED, EVEN IF
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* MICROCHIP HAS BEEN ADVISED OF THE POSSIBILITY OR THE DAMAGES ARE
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* FORESEEABLE. TO THE FULLEST EXTENT ALLOWED BY LAW, MICROCHIP'S TOTAL
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* LIABILITY ON ALL CLAIMS IN ANY WAY RELATED TO THIS SOFTWARE WILL NOT EXCEED
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* THE AMOUNT OF FEES, IF ANY, THAT YOU HAVE PAID DIRECTLY TO MICROCHIP FOR
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* THIS SOFTWARE.
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*/
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#ifndef TEST_HAL_H_
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#define TEST_HAL_H_
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#include "atca_test.h"
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#ifdef __cplusplus
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extern "C" {
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#endif
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/* Test Commands */
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int hal_tests(int argc, char* argv[]);
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/* Common test setup/teardown */
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extern const char* TEST_GROUP_hal;
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void TEST_hal_SETUP(void);
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void TEST_hal_TEAR_DOWN(void);
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#ifdef __cplusplus
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}
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#endif
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#endif /* TEST_HAL_H_*/

‎test/hal/test_hal_basic.c‎

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/**
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* \file
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* \brief Hal functionality Tests for ECC and TrustAnchor Devices
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*
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* \copyright (c) 2015-2023 Microchip Technology Inc. and its subsidiaries.
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*
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* \page License
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*
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* Subject to your compliance with these terms, you may use Microchip software
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* and any derivatives exclusively with Microchip products. It is your
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* responsibility to comply with third party license terms applicable to your
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* use of third party software (including open source software) that may
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* accompany Microchip software.
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*
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* THIS SOFTWARE IS SUPPLIED BY MICROCHIP "AS IS". NO WARRANTIES, WHETHER
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* EXPRESS, IMPLIED OR STATUTORY, APPLY TO THIS SOFTWARE, INCLUDING ANY IMPLIED
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* WARRANTIES OF NON-INFRINGEMENT, MERCHANTABILITY, AND FITNESS FOR A
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* PARTICULAR PURPOSE. IN NO EVENT WILL MICROCHIP BE LIABLE FOR ANY INDIRECT,
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* SPECIAL, PUNITIVE, INCIDENTAL OR CONSEQUENTIAL LOSS, DAMAGE, COST OR EXPENSE
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* OF ANY KIND WHATSOEVER RELATED TO THE SOFTWARE, HOWEVER CAUSED, EVEN IF
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* MICROCHIP HAS BEEN ADVISED OF THE POSSIBILITY OR THE DAMAGES ARE
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* FORESEEABLE. TO THE FULLEST EXTENT ALLOWED BY LAW, MICROCHIP'S TOTAL
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* LIABILITY ON ALL CLAIMS IN ANY WAY RELATED TO THIS SOFTWARE WILL NOT EXCEED
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* THE AMOUNT OF FEES, IF ANY, THAT YOU HAVE PAID DIRECTLY TO MICROCHIP FOR
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* THIS SOFTWARE.
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*/
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#include "atca_test.h"
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#include "test_hal.h"
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#ifndef TEST_HAL_RANDOM_EN
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#define TEST_HAL_RANDOM_EN CALIB_RANDOM_EN || TALIB_RANDOM_EN
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#endif
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TEST_SETUP(hal_basic_tests)
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{
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/* Common Setup */
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TEST_hal_SETUP();
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}
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TEST_TEAR_DOWN(hal_basic_tests)
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{
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/* Common Cleanup */
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TEST_hal_TEAR_DOWN();
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}
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TEST_CONDITION(hal, hal_test_condn)
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{
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ATCADeviceType dev_type = atca_test_get_device_type();
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return (atcab_is_ca_device(dev_type)
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|| atcab_is_ca2_device(dev_type)
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|| atcab_is_ta_device(dev_type));
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}
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/** \brief This test case gets revision number from the device
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*/
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TEST(hal, read_info)
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{
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ATCA_STATUS status = ATCA_GEN_FAIL;
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uint8_t revision[4];
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status = atcab_info(revision);
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TEST_ASSERT_SUCCESS(status);
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}
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/** \brief This test case gets serial number from the device
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*/
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TEST(hal, read_serial_number)
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{
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ATCA_STATUS status;
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uint8_t serialnum[9];
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status = atcab_read_serial_number(serialnum);
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TEST_ASSERT_SUCCESS(status);
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}
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#if TEST_HAL_RANDOM_EN
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TEST_CONDITION(hal, random)
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{
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ATCADeviceType dev_type = atca_test_get_device_type();
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return (atcab_is_ca_device(dev_type) && (ATSHA206A != dev_type))
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|| atcab_is_ta_device(dev_type)
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;
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}
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/** \brief This test case generates random number from the device
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*/
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TEST(hal, random)
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{
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ATCA_STATUS status = ATCA_GEN_FAIL;
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uint8_t randomnum[32];
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status = atcab_random(randomnum);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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}
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#endif
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#if ATCA_TA_SUPPORT
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TEST_CONDITION(hal, ta_single_and_multi_part_write_read)
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{
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ATCADeviceType dev_type = atca_test_get_device_type();
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return (atcab_is_ta_device(dev_type));
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}
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/** \brief This test case creates a handle and checks whether data written is same when read for TA devices
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* Supports both single part and multipart buffers
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*/
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TEST(hal, ta_single_and_multi_part_write_read)
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{
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ATCA_STATUS status;
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ta_element_attributes_t attr_data_handle;
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uint16_t data_handle;
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uint16_t test_element_size[] = { 200, 1021, 1024, 2048 };
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uint8_t write_data_buffer[2048]; //! taking max buffer size for test
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uint8_t read_data_buffer[2048]; //! taking max buffer size for test
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uint16_t write_element_size, read_element_size;
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uint8_t index;
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uint8_t stir_data[16] = { 0 };
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cal_buffer stir_data_buf = CAL_BUF_INIT(sizeof(stir_data), stir_data);
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cal_buffer write_data_buf = { 0 };
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cal_buffer read_data_buf = { 0 };
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// Skip test if setup isn't locked
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test_assert_data_is_locked();
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for (index = 0; index < sizeof(test_element_size) / sizeof(test_element_size[0]); index++)
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{
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write_element_size = test_element_size[index];
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read_element_size = test_element_size[index];
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write_data_buf.len = write_element_size;
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write_data_buf.buf = write_data_buffer;
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read_data_buf.len = read_element_size;
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read_data_buf.buf = read_data_buffer;
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status = talib_handle_init_data(&attr_data_handle, write_element_size);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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status = talib_create_element(atcab_get_device(), &attr_data_handle, &data_handle);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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//Reset data buffers... Read buffer with 0's and Write buffer with random data
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memset(read_data_buf.buf, 0x0, read_data_buf.len);
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status = talib_random(atcab_get_device(), &stir_data_buf, &write_data_buf);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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status = talib_write_element(atcab_get_device(), data_handle, &write_data_buf);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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status = talib_read_element(atcab_get_device(), data_handle, &read_data_buf);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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TEST_ASSERT_EQUAL_MEMORY(write_data_buf.buf, read_data_buf.buf, write_element_size);
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status = talib_delete_handle(atcab_get_device(), (uint32_t)data_handle);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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}
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}
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#endif
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/** \brief This test case checks whether data written is same when read for CA or TA devices
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*/
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TEST(hal, single_part_write_read)
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{
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ATCA_STATUS status = ATCA_SUCCESS;
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uint8_t write_data[64];
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uint8_t read_data[sizeof(write_data)];
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uint16_t slot;
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/* Note - This test assumes ECC slot sizes */
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if (atcab_is_ca2_device(gCfg->devtype))
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{
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/* This test for the ECC204 needs to be run when the device data is unlocked
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Config Subzone 0 and 1 should be locked */
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test_assert_config_is_locked();
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test_assert_data_is_unlocked();
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}
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else
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{
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/* For all other devices it has to be run when data zone is locked */
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test_assert_data_is_locked();
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}
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status = atca_test_config_get_id(TEST_TYPE_DATA, &slot);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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if (!atcab_is_ca2_device(gCfg->devtype))
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{
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#if CALIB_RANDOM_EN
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// Generate random data to be written
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status = atcab_random(&write_data[0]);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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status = atcab_random(&write_data[ATCA_BLOCK_SIZE]);
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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#endif
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}
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else
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{
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memset(write_data, 0x5A, sizeof(write_data));
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}
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// Test cross-block writes
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status = atcab_write_bytes_zone(ATCA_ZONE_DATA, slot, 4, write_data, sizeof(write_data));
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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if (!atcab_is_ca2_device(gCfg->devtype))
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{
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status = atcab_read_bytes_zone(ATCA_ZONE_DATA, slot, 4, read_data, sizeof(read_data));
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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}
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else
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{
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status = atcab_read_bytes_zone(ATCA_ZONE_DATA, slot, 128, read_data, sizeof(read_data));
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TEST_ASSERT_EQUAL(ATCA_SUCCESS, status);
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}
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TEST_ASSERT_EQUAL_MEMORY(write_data, read_data, sizeof(write_data));
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}
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// *INDENT-OFF* - Preserve formatting
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t_test_case_info hal_basic_tests[] =
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{
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{ REGISTER_TEST_CASE(hal, read_info), REGISTER_TEST_CONDITION(hal, hal_test_condn) },
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{ REGISTER_TEST_CASE(hal, read_serial_number), REGISTER_TEST_CONDITION(hal, hal_test_condn) },
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#if TEST_HAL_RANDOM_EN
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{ REGISTER_TEST_CASE(hal, random), REGISTER_TEST_CONDITION(hal, random) },
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#endif
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#if ATCA_TA_SUPPORT
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{ REGISTER_TEST_CASE(hal, ta_single_and_multi_part_write_read), REGISTER_TEST_CONDITION(hal, ta_single_and_multi_part_write_read) },
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#endif
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{ REGISTER_TEST_CASE(hal, single_part_write_read), REGISTER_TEST_CONDITION(hal, hal_test_condn) },
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/* Array Termination element*/
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{ (fp_test_case)NULL, NULL },
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};
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// *INDENT-OFF*
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