Commit bc06437
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fix: correct IEEE 754 test expectations for inf+(-inf) and (-0)+(+0)
IEEE 754 §6.3 specifies that (-0)+(+0) = +0 and inf+(-inf) = NaN.
The arithmetic implementation was already correct; the test expectations
were wrong. Also remove stale doc comments claiming inf+(-inf) returns +0.1 parent bf640ad commit bc06437
3 files changed
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